1/f noise in miniature polycrystalline- and MBE-grown Al films

Shouray Kumar Sahu^1*, Yen-Hsun Glen Lin⁴, Kuan-Hui Lai³, Min-Yen Wu², Ray-Tai Wang², Elica Anne Heredia¹, Juainai Kwo⁴, Ming-Hwei Hong³, Yen-Hsiang Lin⁴, Juhn-Jong Lin², Sheng-Shiuan Yeh^1,5

¹International college of semiconductor technology, National Yang Ming Chiao Tung University, Hsinchu City, Taiwan
²Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
³Graduate Institute of Applied Physics and Department of Physics, National Taiwan University, Taipei, Taiwan
⁴Department of Physics, National Tsing Hua University, Hsinchu, Taiwan
⁵Center for Emergent Functional Matter Science, National Yang Ming Chiao Tung University, Hsinchu, Taiwan

* Presenter:Shouray Kumar Sahu, email:shouray26@gmail.com

Abstract:
Quantum computing holds significant promise for applications in various domains, notably in simulating quantum systems and specific algorithms such as factorization, search, and optimization. The superconducting Al materials are widely used in quantum bits (qubits) and quantum circuits, which are the building blocks of a quantum computer. However, the unavoidable dynamic defects, modeled as two-level systems (TLS), in materials would generate 1/f noise and hamper the quantum coherence time. Thus, the investigation of the 1/f noise property and the inferred information of these dynamic defects in Al materials are crucial for improving the performance of these quantum devices. In this work, we will present the preliminary measurement and analysis of the 1/f noise property in miniature polycrystalline- and MBE-grown Al films.

Keywords: 1/f noise, dynamic defect, two-level system, superconducting qubit, Al film.